The 8200 Series generates measurement results, not just raw data, with time and amplitude histograms, mask testing and statistical measurements. It provides a communications-tailored measurement set that includes jitter, noise, duty cycle, overshoot, undershoot, OMA, extinction ratio, Q-factor, mean optical power, and amplitude measurements for both RZ and NRZ signals. Compliance-based mask testing of high speed optical and electrical communications, and computer standards such as SDH/SONET, Ethernet, Fibre Channel is included. Color-grading and gray-scale grading of waveform data adds a third dimension, sample density, to signal acquisition and analyses. The industry’s first variable persistence database allows exact data and measurement aging on all of the functions, and facilitates dynamic update on DUTs under adjustment.
The 8200 Series combines very low timebase jitter with very fast acquisition rate. It can acquire the data in several time windows, each with its own acquisition parameters and display window. It provides a comprehensive suite of measurement capabilities to evaluate the data, as well as acquisition math and waveform math functionality to further process the results with histograms, mask testing and statistics.
The 8200 Series provides great data storage flexibility with four 3D databases available simultaneously; the databases offer an industry-first variable persistence with accurate data aging. Color-grading of waveform data adds a third dimension, sample density, to signal acquisitions and analyses.
The CSA8200 and TDS8200 models share the same capabilities; either model, for example, may be configured with any combination of sampling modules.
Features & Benefits
DC to 70+ GHz*1
Bandwidth Industry-leading Timebase Accuracy
– Jitter <200 fsRMS with 82A04 – 800 fsRMS Standard
Modular Architecture with Up to Eight Acquisition Channels
Advanced Jitter, Noise and BER analysis
– Analysis of High-speed Serial Data Rates from 1 Gb/s to 60 Gb/s Provides Insight Into Precise Causes of Eye Closure
– Separation of Both Jitter and Noise Provides Highly Accurate Extrapolation of BER and Eye Contour
High performance TDR/TDT
– True Differential Step Generator and Signal Acquisition
– <28 ps Reflected Rise Time – Up to 4 Differential Pairs (8 channels) – High Fidelity Differential and Single-ended Probing Automated Standards Mask Testing
– Communications Standards Including Sonet/SDH, Ethernet, OIF and Fibre Channel
– Computer Standards Including SATA, SAS, PCI Express and Rapid IO Automated Measurement System with Over 100 NRZ, Pulse and RZ Measurements FrameScan® Acquisition Mode
– Isolate Data Dependent Faults
– Signal Averaging to Examine Low-power Signal Four Color Graded Variable Persistence Waveform Databases Microsoft Windows 2000 Operating System
Options
